Optical Characterisation of MOVPE Grown Vertically Correlated InAs/GaAs Quantum Dots

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dc.contributor.author Hazdra P. en_US
dc.contributor.author Voves J. en_US
dc.contributor.author Oswald J. en_US
dc.contributor.author Kuldová K. en_US
dc.contributor.author Hospodková A. en_US
dc.contributor.author Hulicius E. en_US
dc.contributor.author Pangrác J. en_US
dc.date.accessioned 2007-02-20T13:15:34Z
dc.date.available 2007-02-20T13:15:34Z
dc.date.issued 2006 en_US
dc.identifier.citation European Nano Systems 2006, Paris, France, 14-15 December 2006, ENS 2006, Co-locating with Nano Transfer 2006, The 2nd Worshop on Nano Technology Transfer in Europe, p. 9613 en_US
dc.identifier.isbn 2-916187-05-7 en_US
dc.identifier.uri http://hdl.handle.net/2042/6799
dc.description.abstract InAs, GaAs, quantum dots, photomodulated reflectance spectroscopy, photoluminescence, electronic statesStructures with self-organised InAs quantum dots in a GaAs matrix were grown by the low pressure metal-organic vapour phase epitaxy (LP-MOVPE) technique. Photoluminescence in combination with photomodulated reflectance spectroscopy were used as the main characterisation methods for the growth optimisation. Results show that photoreflectance spectroscopy is an excellent tool for characterisation of QD structures wetting layers (thickness and composition) and for identification of spacers in vertically stacked QDs structures. en_US
dc.format.extent 299583 bytes
dc.format.mimetype application/pdf
dc.language.iso EN en_US
dc.publisher TIMA Editions , Grenoble, France en_US
dc.rights http://irevues.inist.fr/utilisation en_US
dc.source European Nano Systems 2006, Paris, France, 14-15 December 2006, ENS 2006, Co-locating with Nano Transfer 2006, The 2nd Worshop on Nano Technology Transfer in Europe, p. 9613 en_US
dc.subject InAs, GaAs, quantum dots, photomodulated reflectance spectroscopy, photoluminescence, electronic states en_US
dc.title Optical Characterisation of MOVPE Grown Vertically Correlated InAs/GaAs Quantum Dots en_US
dc.type Conference proceeding en_US
dc.contributor.affiliation Czech Technical University - Dept. of Microelectronics [Czech Republic] en_US
dc.contributor.affiliation Czech Technical University - Dept. of Microelectronics [Czech Republic] en_US
dc.contributor.affiliation Institute of Physics ASCR [Czech Republic] en_US
dc.contributor.affiliation Institute of Physics ASCR [Czech Republic] en_US
dc.contributor.affiliation Institute of Physics ASCR [Czech Republic] en_US
dc.contributor.affiliation Institute of Physics ASCR [Czech Republic] en_US
dc.contributor.affiliation Institute of Physics ASCR [Czech Republic] en_US


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