A COMPARISON BETWEEN 1.5µm PHOTOLUMINESCENCE FROM Er-DOPED Si-RICH SiO2 FILMS AND (Er,Ge) CO-DOPED SiO2 FILMS

Show simple item record

dc.contributor.author Mayandi J. en_US
dc.contributor.author Finstad T. G. en_US
dc.contributor.author Heng C. L. en_US
dc.contributor.author Li Y. J. en_US
dc.contributor.author Thøgersen A. en_US
dc.contributor.author Foss S. en_US
dc.contributor.author Klette H. en_US
dc.date.accessioned 2007-02-20T13:15:17Z
dc.date.available 2007-02-20T13:15:17Z
dc.date.issued 2006 en_US
dc.identifier.citation European Nano Systems 2006, Paris, France, 14-15 December 2006, ENS 2006, Co-locating with Nano Transfer 2006, The 2nd Worshop on Nano Technology Transfer in Europe, p. 1-4 en_US
dc.identifier.isbn 2-916187-05-7 en_US
dc.identifier.uri http://hdl.handle.net/2042/6784
dc.description.abstract photoluminescence, nanoclusters, erbium, Transmission electron microscopyWe have studied the 1.5 µm photoluminescence (PL) from Er ions after annealing two different sample sets in the temperature range 500 °C to 1100 °C. The different sample sets were made by magnetron sputtering from composite targets of Si+SiO2+Er and Ge+SiO2+Er respectively for the different sample sets. The annealing induces Si - and Ge-nanoclusters respectively in the different film sets. The PL peak reaches its maximum intensity after annealing at 700 °C for samples with Ge nanoclusters and after annealing at 800 °C for samples with Si. No luminescence from nanoclusters was detected in neither sample sets. This is interpreted as an energy transfer from the nanocluster to Er atoms. Transmission electron microscopy shows that after annealing to the respective temperature yielding the maximum PL intensity both the Ge and Si clusters are non-crystalline. Here we mainly compare the spectral shape of Er luminescence emitted in these different nanostructured matrixes. The PL spectral shapes are clearly different and witness a different local environment for the Er ions. en_US
dc.format.extent 399780 bytes
dc.format.mimetype application/pdf
dc.language.iso EN en_US
dc.publisher TIMA Editions , Grenoble, France en_US
dc.rights http://irevues.inist.fr/utilisation en_US
dc.source European Nano Systems 2006, Paris, France, 14-15 December 2006, ENS 2006, Co-locating with Nano Transfer 2006, The 2nd Worshop on Nano Technology Transfer in Europe, p. 1-4 en_US
dc.subject photoluminescence, nanoclusters, erbium, Transmission electron microscopy en_US
dc.title A COMPARISON BETWEEN 1.5µm PHOTOLUMINESCENCE FROM Er-DOPED Si-RICH SiO2 FILMS AND (Er,Ge) CO-DOPED SiO2 FILMS en_US
dc.type Conference proceeding en_US
dc.contributor.affiliation University of Oslo [Norway] en_US
dc.contributor.affiliation University of Oslo [Norway] en_US
dc.contributor.affiliation University of Oslo [Norway] en_US
dc.contributor.affiliation University of Oslo [Norway] en_US
dc.contributor.affiliation University of Oslo [Norway] en_US
dc.contributor.affiliation University of Oslo [Norway] en_US
dc.contributor.affiliation SINTEF [Norway] en_US


Files in this item

PDF ECB1.pdf 399.7Kb

This item appears in the following Collection(s)

Show simple item record





Advanced Search