Cell Architecture for Nanoelectronic Design

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URI: http://hdl.handle.net/2042/6779
Title: Cell Architecture for Nanoelectronic Design
Author: Martorell F.; Rubio A.
Abstract: Nanoarchitectures, fault-tolerance, defect-tolerance, noise-tolerance, averaging cellSeveral nanoelectronic devices have been already proved. However, no architecture which makes use of them provides a feasible opportunity to build medium/large systems. Nanoarchitecture proposals only solve a small part of the problems needed to achieve a real design. In this paper, we propose and analyze a cell architecture that overcomes most of those at the gate level. Using the cell structure we build 2 and 3-input NAND gates showing their error probabilities. Finally, we outline a method to further improve the structure’s tolerance by taking advantage of interferences among nanodevices. Using this improvement we show that it is possible to reduce the output standard deviation by a factor larger than ãN and restitute the signal levels using nanodevices.
Subject: Nanoarchitectures, fault-tolerance, defect-tolerance, noise-tolerance, averaging cell
Publisher: TIMA Editions , Grenoble, France
Date: 2006

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