Quantitative 3w-scanning thermal microscopy : Modelling the AC/DC coupling and the sample heat conduction

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dc.contributor.author Chapuis, P.-O. en_US
dc.contributor.author Kumar Saha, S. en_US
dc.contributor.author Volz, S. en_US
dc.date.accessioned 2006-12-12T13:48:00Z
dc.date.available 2006-12-12T13:48:00Z
dc.date.issued 2006 en_US
dc.identifier.citation Proceedings of 12th International Workshop on Thermal investigations of ICs, THERMINIC 2006, p. 210-213 en_US
dc.identifier.isbn 2-916187-04-9 en_US
dc.identifier.other handle TIMA 2243/therminic2006_Q3O210 en_US
dc.identifier.uri http://hdl.handle.net/2042/6572
dc.description.abstract A way to increase the Scanning Thermal Microscope (SThM) sensitivity in the harmonic 3w mode is to heat the probe with an AC current sufficiently high to generate a coupling between the AC and the DC signals. We detail in this paper how to properly take into account this coupling with a Wollaston-probe SThM. We also show how to link correctly the thermal conductivity to the thermal conductance measured by the SThM. en_US
dc.format.extent 190460 bytes
dc.format.mimetype application/pdf
dc.language.iso EN en_US
dc.publisher TIMA Editions , Grenoble, France en_US
dc.rights http://irevues.inist.fr/utilisation en_US
dc.source Proceedings of 12th International Workshop on Thermal investigations of ICs, THERMINIC 2006, p. 210-213 en_US
dc.subject Scanning thermal microscopy (SThM), Thermal conductivity en_US
dc.title Quantitative 3w-scanning thermal microscopy : Modelling the AC/DC coupling and the sample heat conduction en_US
dc.type Conference proceeding en_US
dc.contributor.affiliation Laboratoire d'Energetique Moleculaire et Macroscopique, Combustion CNRS UPR 288 - Ecole Centrale Paris [France] en_US
dc.contributor.affiliation EM2C - Ecole Centrale Paris [France] en_US
dc.contributor.affiliation Groupement de Recherche Micro et Nanothermique, GDR CNRS 2503 - Ecole Centrale Paris [France] en_US


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