The application of Artificial Neural Network for the assessment of thermal properties of multi-layer semiconductor structure

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URI: http://hdl.handle.net/2042/6541
Title: The application of Artificial Neural Network for the assessment of thermal properties of multi-layer semiconductor structure
Author: Suszynski, Z.; Kosikowski, M.; Duer, R.
Abstract: artificial neural network, thermal properties, invers problem, complex contrastIn this paper, the solution of the problem of identification of thermal properties of investigated multi-layer structure is presented. In order of that, artificial neural network was used to find the set of thermal properties for which the complex contrast characteric derived fits the best to the one evaluated basing upon experimenatal data.
Subject: artificial neural network, thermal properties, invers problem, complex contrast
Publisher: TIMA Editions , Grenoble, France
Date: 2006

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