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Search Results for Collection: 2005 - International Workshop on Thermal Investigation of ICs and Systems

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Quantitative thermoreflectance imaging : calibration method and validation on a dedicated integrated circuit

Tessier, G.; Pavageau, S.; Filloy, C.; Charlot, B.; Jerosolimski, G.; Fournier, D.; Cretin, B.; Trannoy, N.; Vairac, P.; Jerosolimski, G.; Gomès, S.; Dilhaire, S.; Volz , S. (TIMA Editions , Grenoble, France, 2006)

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